In sub-50nm technologies, parameter variations and leakage currents are becoming one of the major issues. In order to have robust operations, there is a need for error resiliency under parameter variations. Unfortunately, error resiliency have conflicting requirements with low-power design requirements. In this talk, I will present voltage over-scaling as a means of lowering power dissipation and will consider several design methodologies at different levels of design abstraction (circuits, architecture, and algorithms) to achieve error resiliency under voltage over-scaling. Logic, memory, and signal processing applications will be covered.

Host: Lin Zhong

Biography of Kaushik Roy:
Kaushik Roy received B.Tech. degree in electronics and electrical communications engineering from the Indian Institute of Technology, Kharagpur, India, and Ph.D. degree from the electrical and computer engineering department of the University of Illinois at Urbana-Champaign in 1990. He was with the Semiconductor Process and Design Center of Texas Instruments, Dallas, where he worked on FPGA architecture development and low-power circuit design. He joined the electrical and computer engineering faculty at Purdue University, West Lafayette, IN, in 1993, where he is currently a Professor and holds the Roscoe H. George Chair of Electrical & Computer Engineering. His research interests include VLSI design/CAD for nano-scale Silicon and non-Silicon technologies, low-power electronics for portable computing and wireless communications, VLSI testing and verification, and reconfigurable computing. Dr. Roy has published more than 450 papers in refereed journals and conferences, holds 8 patents, graduated more than 45 PhD students, and is co-author of two books on Low Power CMOS VLSI Design (John Wiley & McGraw Hill).

Dr. Roy received the National Science Foundation Career Development Award in 1995, IBM faculty partnership award, ATT/Lucent Foundation award, 2005 SRC Technical Excellence Award, SRC Inventors Award, Purdue College of Engineering Research Excellence Award, and best paper awards at 1997 International Test Conference, IEEE 2000 International Symposium on Quality of IC Design, 2003 IEEE Latin American Test Workshop, 2003 IEEE Nano, 2004 IEEE International Conference on Computer Design, 2006 IEEE/ACM International Symposium on Low Power Electronics & Design, and 2005 IEEE Circuits and system society Outstanding Young Author Award (Chris Kim), 2006 IEEE Transactions on VLSI Systems best paper award. Dr. Roy is Purdue University Faculty Scholar. Dr. Roy was a Research Visionary Board Member of Motorola Labs (2002). He has been in the editorial board of IEEE Design and Test, IEEE Transactions on Circuits and Systems, and IEEE Transactions on VLSI Systems. He was Guest Editor for Special Issue on Low-Power VLSI in the IEEE Design and Test (1994) and IEEE Transactions on VLSI Systems (June 2000), IEE Proceedings -- Computers and Digital Techniques (July 2002). Dr. Roy is a fellow of IEEE.
Speaker URL