Biography of Yoram Bresler:
Yoram Bresler received the B.Sc. (cum laude) and M.Sc. degrees from the Technion, Israel Institute of Technology, and the Ph.D de¬gree from Stanford University, all in Electrical Engineering. In 1987 he joined the University of Illinois at Urbana-Champaign, where he is currently the GEBI Founder Professor of Engineering at the Departments of Electrical and Computer Engineering and Bioengineering, and at the Co¬ordinated Science Laboratory. He is also President and Chief Technology O?cer at In¬staRecon, Inc., a startup he co-founded to commercialize breakthrough technology for tomographic reconstruction developed in his academic research. His current research in¬terests include statistical signal processing and machine learning for signal processing, and their applications to inverse problems in imaging, and in particular compressed sensing, computed tomography, and MRI. Dr. Bresler has served on the editorial board of several journals, including the IEEE Transactions on Signal Processing, the IEEE Journal on Selected Topics in Signal Processing, Machine Vision and Applications, and the SIAM Journal on Imaging Science, and on various committees of the IEEE. Dr. Bresler is a fellow of the IEEE and of the AIMBE. He received two Best Journal Paper Awards from the IEEE Signal Processing society, and two papers he coauthored with his students received the Young Author Best Journal Paper Award from the same society, in 2001 and 2016, respectively. He is the recipient of a 1991 NSF Presidential Young Investigator Award, the Technion (Israel Inst. of Technology) Fellowship in 1995, and the Xerox Senior Award for Faculty Research in 1998. He was named a University of Illinois Scholar in 1999, appointed as an Associate at the Center for Advanced Study of the University in 2001-2, and Faculty Fellow at the National Cener for Supercomputing Ap¬plications (NCSA) in 2006. In 2016 he was appointed an IEEE Signal Processing Society Distinguished Lecturer.